In this work it is presented and evaluated two strategies to achieve the optimization of the variance of delay in nanoelectronic digital circuits, taking into account the variations due to the manufacturing process. The evaluations of both strategies are developed through applications in 8 ISCAS circuits. The results show comparisons in percentage changes in the variances of delay time and power consumption on each circuit because of applying these two strategies. In this article, the results are presented in full form for all tested circuits. One of the strategies is called ONE TRACK and the other TRACKING. The first uses the LaGrange method with Karush Kuhn Tucker's theorem and the second develops a progressive resizing, increasing the width of the critical gates in discrete steps of constant value as far as restrictions allow. During the application of the procedure, the total state of the circuit is evaluated in each step. In both strategies, the variance of the delay time is optimized with restriction of the area used and the power consumed is calculated. The results are presented in tabular and graphical form. Finally, conclusions and observations from the study are issued. The codes are implemented in C++ and it is used a 65 nm technology.