Title
Stigmatic X-ray imaging using a single spherical Laue crystal
Date Issued
01 January 2013
Access level
open access
Resource Type
conference paper
Author(s)
Del Rio M.
Bianchi D.
Pikuz T.
Faenov A.
Pikuz S.
Pablant N.
Bitter M.
Hill K.
Princeton University
Publisher(s)
Institute of Physics Publishing
Abstract
We propose a crystal configuration using a single Laue spherical crystal for imaging applications. A crystal in Laue geometry set to focus a divergent beam in the meridional (diffraction) plane, but does not focus in the sagittal plane. A transmission object placed in the beam is imaged with different horizontal and vertical aspect ratio, but it is possible to find a configuration with similar aspect ratio. This system is studied using ray tracing, which permit to reproduce preliminary experimental data [1]. The concept of a stigmatic focusing by a single optical element may have applications in imaging, like in transmission microscopy or for hard X-ray backlighting and self-imaging in high energy density plasma experiments. Inertial confinement fusion experiments and large tokamak projects such as ITER may benefit from this optical configuration.
Volume
425
Issue
PART 19
Language
English
OCDE Knowledge area
Óptica Física de plasmas y fluídos Radiología, Medicina nuclear, Imágenes médicas
Scopus EID
2-s2.0-84876213646
ISSN of the container
17426588
Conference
Journal of Physics: Conference Series - 11th International Conference on Synchrotron Radiation Instrumentation, SRI 2012
Sources of information: Directorio de Producción Científica Scopus