Title
Exploring area and total wirelength using a cell merging technique
Date Issued
01 October 2019
Access level
metadata only access
Resource Type
conference paper
Author(s)
Publisher(s)
IEEE Computer Society
Abstract
The industry of Integrated Circuits (ICs) has been making increasingly complex chips with up to billions of transistors in a single die. As we cannot do the design flow by hand, the leading adopted solution to deal with this challenge has been to use a pre-designed library of standard cells and using EDA tools to automate the process. Nevertheless, the resulting netlist is not as efficient in terms of the number of transistors as a handmade design, possibly reflecting in the overall area, power, and delay of the circuit. To generate cells on-demand is a way to improve this inherent limitation, as previous works demonstrate. In this paper, we investigate a netlist optimization methodology based on gate merging and its impacts regarding area and wire-length when applied to the Nagate's Open Cell Library for 45nm. We obtained a reduction in area and total wire-length of 3.5 and 4.2 on average, respectively.
Start page
329
End page
334
Volume
2019-October
Language
English
OCDE Knowledge area
Ciencias de la información
Ingeniería eléctrica, Ingeniería electrónica
Subjects
Scopus EID
2-s2.0-85076816631
Source
IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
Resource of which it is part
IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
ISSN of the container
23248432
ISBN of the container
978-172813915-9
Conference
27th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019
Sponsor(s)
The authors would like to thanks the Brazilian agencies CNPq, CAPES and FAPERGS for the financial support.
Sources of information:
Directorio de Producción Científica
Scopus