cris.boxmetadata.label.title
ELECTRICAL PROPERTIES AND STRUCTURAL DEFECTS IN EPITAXIAL CaF<inf>2</inf> ON Si.
cris.boxmetadata.label.dateissued
01 browse.startsWith.months.january 1986
cris.boxmetadata.label.accesslevel
metadata only access
cris.boxmetadata.label.resourcetype
conference paper
cris.boxmetadata.label.authors
Schowalter L.J.
Fathauer R.W.
Ponce F.A.
Anderson G.
Hashimoto S.
cris.boxmetadata.label.publisher
Materials Research Soc
cris.boxmetadata.label.citationstartpage
125
cris.boxmetadata.label.citationendpage
133
cris.boxmetadata.label.volume
67
cris.boxmetadata.label.language
English
cris.boxmetadata.label.ocdeknowledgeArea
Electroquímica
cris.boxmetadata.label.doi
10.1557/proc-67-125
cris.boxmetadata.label.scopusidentifier
2-s2.0-0022907448
cris.boxmetadata.label.containerissn
02729172
cris.boxmetadata.label.containerisbn
0931837332
cris.boxmetadata.label.conference
Materials Research Society Symposia Proceedings
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