Title
Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs
Date Issued
01 January 2014
Access level
metadata only access
Resource Type
journal article
Author(s)
Universidad Federal de Río Grande del Sur
Publisher(s)
Institute of Electrical and Electronics Engineers Inc.
Abstract
In this paper the fault-masking capability of N-modular redundancy systems synthesized into SRAM-based FPGAs is evaluated. In the proposed N-modular technique an original self-adaptive majority voter elects the outputs of the redundant modules. Experimentally evaluated neutron cross-section, area, and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies. © 2014 IEEE.
Start page
1558
End page
1566
Volume
61
Issue
4
Language
English
OCDE Knowledge area
Física nuclear
Ciencias de la computación
Subjects
Scopus EID
2-s2.0-84906782937
Source
IEEE Transactions on Nuclear Science
ISSN of the container
00189499
Sources of information:
Directorio de Producción Científica
Scopus