Title
Controlled electroplating and electromigration in nickel electrodes for nanogap formation
Date Issued
05 November 2010
Access level
metadata only access
Resource Type
journal article
Author(s)
De Los Santos Valladares L.
Dominguez A.B.
Mitrelias T.
Sfigakis F.
Khondaker S.I.
Barnes C.H.W.
Majima Y.
Publisher(s)
Institute of Physics Publishing
Abstract
We report the fabrication of nickel nanospaced electrodes by electroplating and electromigration for nanoelectronic devices. Using a conventional electrochemical cell, nanogaps can be obtained by controlling the plating time alone and after a careful optimization of electrodeposition parameters such as electrolyte bath, applied potential, cleaning, etc. During the process, the gap width decreases exponentially with time until the electrode gaps are completely bridged. Once the bridge is formed, the ex situ electromigration technique can reopen the nanogap. When the gap is ∼1 nm, tunneling current-voltage characterization shows asymmetry which can be corrected by an external magnetic field. This suggests that charge transfer in the nickel electrodes depends on the orientation of magnetic moments. © 2010 IOP Publishing Ltd.
Volume
21
Issue
44
Number
445304
Language
English
OCDE Knowledge area
Nano-tecnología
Ingeniería eléctrica, Ingeniería electrónica
Scopus EID
2-s2.0-77958526562
Source
Nanotechnology
ISSN of the container
13616528
Sources of information:
Directorio de Producción Científica
Scopus