Title
SIM.EM-S5 voltage, current and resistance comparison
Date Issued
03 October 2012
Access level
metadata only access
Resource Type
conference paper
Author(s)
Sanchez H.
Cioffi J.
Kyriazis G.
Ramos R.
Martinez A.
Montaluisa J.
Gonzalez J.
Hamilton F.
Elmquist R.
Zhang N.F.
Izquierdo D.
Indecopi Instituto Nacional de Defensa de la Competencia y de la Protección de la Propiedad Intelectual
Abstract
This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of equivalence between those laboratories in accordance with the CIPM Mutual Recognition Agreement. From June 2007 to October 2009, four multimeters were used as traveling standards for measurements in eleven countries, with NIST-USA acting as pilot laboratory. Results for nine measurement points are presented as errors relative to a comparison reference value together with their uncertainty. © 2012 IEEE.
Start page
566
End page
567
Language
English
OCDE Knowledge area
Ingeniería eléctrica, Ingeniería electrónica
Subjects
Scopus EID
2-s2.0-84866787251
Resource of which it is part
CPEM Digest (Conference on Precision Electromagnetic Measurements)
ISSN of the container
05891485
ISBN of the container
978-146730439-9
Conference
2012 Conference on Precision Electromagnetic Measurements, CPEM 2012
Sources of information:
Directorio de Producción Científica
Scopus