Title
Surface microscopy characterizations of large size graphene films grown by surface segregation on Ni and transferred to Si/SiO<inf>2</inf> substrate
Date Issued
01 January 2009
Access level
open access
Resource Type
conference paper
Author(s)
Purdue University
Publisher(s)
Electrochemical Society Inc.
Abstract
We report surface microscopy characterizations of large size graphene films (up to mm) grown on polycrystalline Ni foils and transferred to Si/SiO 2. Wrinkles in such films are studied by both atomic force microscopy (AFM) and scanning tunneling microscopy (STM). Local graphitic lattice structures of the films are imaged with atomic-resolution STM and compared with those of the highly ordered pyrolytic graphite (HOPG). © The Electrochemical Society.
Start page
75
End page
80
Volume
19
Issue
5
Language
English
OCDE Knowledge area
Ingeniería de materiales
Scopus EID
2-s2.0-77149178448
Source
ECS Transactions
ISSN of the container
19385862
ISBN of the container
9781607680635
Sponsor(s)
Dielectric Science and Technology
Electronics and Photonics
Fullerenes, Nanotubes, and Carbon Nanostructures
Sources of information:
Directorio de Producción Científica
Scopus