Title
Development of a spatially resolving x-ray crystal spectrometer for measurement of ion-temperature (Ti) and rotation-velocity (v) profiles in ITER
Date Issued
01 October 2010
Access level
open access
Resource Type
conference paper
Author(s)
Hill K.W.
Bitter M.
Johnson D.
Feder R.
Beiersdorfer P.
Dunn J.
Morris K.
Wang E.
Reinke M.
Podpaly Y.
Rice J.E.
Barnsley R.
O'Mullane M.
Lee S.G.
Princeton University
Abstract
Imaging x-ray crystal spectrometer (XCS) arrays are being developed as a US-ITER activity for Doppler measurement of Ti and v profiles of impurities (W, Kr, and Fe) with ∼7 cm (a/30) and 10-100 ms resolution in ITER. The imaging XCS, modeled after a prototype instrument on Alcator C-Mod, uses a spherically bent crystal and 2D x-ray detectors to achieve high spectral resolving power (E/dE>6000) horizontally and spatial imaging vertically. Two arrays will measure Ti and both poloidal and toroidal rotation velocity profiles. The measurement of many spatial chords permits tomographic inversion for the inference of local parameters. The instrument design, predictions of performance, and results from C-Mod are presented. © 2010 American Institute of Physics.
Volume
81
Issue
10
Language
English
OCDE Knowledge area
Radiología, Medicina nuclear, Imágenes médicas Física de partículas, Campos de la Física Óptica
Scopus EID
2-s2.0-78149458646
ISSN of the container
00346748
Conference
Review of Scientific Instruments
Sponsor(s)
This work was supported by the U.S. Department of Energy under Contract No. DE-ACO2-76-CHO-3073.
Sources of information: Directorio de Producción Científica Scopus