Title
Optical probing of interface roughness in resonant tunneling structures
Date Issued
15 July 1997
Access level
metadata only access
Resource Type
journal article
Author(s)
Instituto de Fisica Gleb Wataghin
Publisher(s)
American Institute of Physics Inc.
Abstract
We report on photoluminescence (PL) and photoluminescence-excitation measurements in GaAs/In0.1Ga0.9As/AlAs double-barrier tunneling structures as a function of bias voltage and temperature. We have observed a splitting in the quantum well photoluminescence due to island formation in the quantum well. We have a good correlation between the variation of integrated PL intensity, linewidth, and tunnel current bias for both lines. The temperature dependence of photoluminescence spectra shows that transfer of carrier between islands can be tuned by the applied bias and that states in different islands are populated by electrons in the resonant tunneling process. © 1997 American Institute of Physics.
Start page
810
End page
812
Volume
82
Issue
2
Language
English
OCDE Knowledge area
FÃsica de partÃculas, Campos de la FÃsica
DOI
Scopus EID
2-s2.0-3843060009
Source
Journal of Applied Physics
ISSN of the container
00218979
Sources of information:
Directorio de Producción CientÃfica
Scopus