Title
Characterization of resonant tunneling paths in current-voltage characteristics line shapes
Date Issued
01 January 1995
Access level
metadata only access
Resource Type
journal article
Author(s)
Universidade Estadual de Campinas
Abstract
We analyze the current density-voltage characteristics of double-barrier tunneling diodes, with different spacer layers, within the framework of a Poisson solver together with a coherent tunneling approximation for transmission probabilities. We show that varying the spacer layer thickness, together with barrier heights, changes dramatically the current density-voltage characteristics line shape, which is revealed to be an important qualitative signature of the tunneling paths involved in the double-barrier diodes under operation.© 1995 American Institute of Physics.
Start page
2675
Volume
67
Language
English
OCDE Knowledge area
Física de la materia condensada
Scopus EID
2-s2.0-0347646665
Source
Applied Physics Letters
ISSN of the container
00036951
Sources of information: Directorio de Producción Científica Scopus