Title
Characterization of resonant tunneling paths in current-voltage characteristics line shapes
Date Issued
01 January 1995
Access level
metadata only access
Resource Type
journal article
Author(s)
Schulz P.
Universidade Estadual de Campinas
Abstract
We analyze the current density-voltage characteristics of double-barrier tunneling diodes, with different spacer layers, within the framework of a Poisson solver together with a coherent tunneling approximation for transmission probabilities. We show that varying the spacer layer thickness, together with barrier heights, changes dramatically the current density-voltage characteristics line shape, which is revealed to be an important qualitative signature of the tunneling paths involved in the double-barrier diodes under operation.© 1995 American Institute of Physics.
Start page
2675
Volume
67
Language
English
OCDE Knowledge area
Física de la materia condensada
DOI
Scopus EID
2-s2.0-0347646665
Source
Applied Physics Letters
ISSN of the container
00036951
Sources of information:
Directorio de Producción Científica
Scopus