Title
Comparison and evaluation of measured and simulated high-frequency capacitance-voltage curves of MOS structures for different interface passivation parameters
Date Issued
2019
Access level
open access
Resource Type
master thesis
Author(s)
SEVILLANO BENDEZU, MIGUEL ANGEL
Publisher(s)
Pontificia Universidad Católica del Perú
Language
English
Subjects
Handle or URL
Advisor(s)
PALOMINO TOFFLINGER, JAN AMARU
Type of research work
Tesis
Degree or title name
Maestro
Granting institution
Sources of information:
Directorio de Producción Científica