Title
Analyzing the effects of TID in an embedded system running in a flash-based FPGA
Date Issued
01 December 2011
Access level
metadata only access
Resource Type
conference paper
Author(s)
Azambuja J.R.
Kastensmidt F.L.
Fonseca E.C.P.
Galhardo R.
Goncalez O.
Universidade Federal Do Rio Grande Do sul
Abstract
This work analyzes the behavior of a designed embedded system composed of microprocessor, memories and SpaceWire (SpW) links under Total Ionizing Dose (TID) synthesized into a commercial flash-based FPGA from Actel. Two tests were performed: one the FPGA is configured just once at the beginning of the irradiation and the other the FPGA is reconfigured every 5 krad (Si). Results evaluate power supply current (Icc), temperature, function operation and performance degradation. © 2011 IEEE.
Start page
2855
End page
2862
Volume
58
Issue
6 PART 1
Language
English
OCDE Knowledge area
Ingeniería eléctrica, Ingeniería electrónica
Informática y Ciencias de la Información
Subjects
Scopus EID
2-s2.0-83855163504
Source
IEEE Transactions on Nuclear Science
ISSN of the container
00189499
Sponsor(s)
Manuscript received July 22, 2011; revised September 08, 2011, September 25, 2011; accepted September 25, 2011. Date of publication November 10, 2011; date of current version December 14, 2011. This work was supported in part by the Brazilian Agencies CNPq and CAPES.
Sources of information:
Directorio de Producción Científica
Scopus