Title
Profiling electric fields in GaN/InGaN/GaN single quantum wells by electron holography
Date Issued
01 December 2001
Access level
metadata only access
Resource Type
conference paper
Author(s)
Abstract
We use electron holography to profile the local internal potential due to spontaneous polarization and piezoelectric effects in strained quantum well structures of wurtzitic group III nitrides. Profiles of the electrostatic potential across a GaN/InxGa1-xN/GaN quantum well structure show the existence of internal electric fields of about -2.2 ± 0.16 MV/cm, and a potential drop across the quantum well of 0.6 ± 0.16 V. The electric fields indicate an average indium composition of 15% in the quantum well, for a thickness of 2.7 nm. This indium composition compares well with measurements by energy-disperse spectroscopy of 18 ± 2 %. Screening effect is not observed under these experimental conditions.
Volume
639
Language
English
OCDE Knowledge area
Electroquímica
Scopus EID
2-s2.0-0035557662
ISSN of the container
02729172
Conference
Materials Research Society Symposium - Proceedings
Sponsor(s)
Samples studied were provided by Lumileds. This work was supported by ONR (N00014-00-1-0133) and MRSEC (NSF, DMR-9632635). The authors acknowledge use of facilities in the Center for High Resolution Electron Microscopy at ASU.
Sources of information: Directorio de Producción Científica Scopus