Title
GENERATION LIFETIME IMPROVEMENT THROUGH INTRINSIC GETTERING IN N-TYPE LT AN BR 100 RT AN BR Si WAFERS.
Date Issued
01 December 1983
Access level
metadata only access
Resource Type
conference paper
Author(s)
Publisher(s)
Electrochemical Soc Inc
Start page
220
End page
228
Volume
September 83
Language
English
OCDE Knowledge area
Electroquímica
Scopus EID
2-s2.0-0020915732
Conference
Proceedings - The Electrochemical Society
Sources of information:
Directorio de Producción Científica
Scopus