Title
New physics in GaN resonant tunneling diodes
Date Issued
01 January 2019
Access level
metadata only access
Resource Type
conference paper
Author(s)
Cornell University
Publisher(s)
SPIE
Abstract
The outstanding material properties of III-Nitride semiconductors, has prompted intense research efforts in order to engineer resonant tunneling transport within this revolutionary family of wide-bandgap semiconductors. From resonant tunneling diode (RTD) oscillators to quantum cascade lasers (QCLs), III-Nitride heterostructures hold the promise for the realization of high-power ultra-fast sources of terahertz (THz) radiation. However, despite the considerable efforts over last two decades, it is only during the last three years that room temperature resonant tunneling transport has been demonstrated within the III-Nitride family of semiconductors. In this paper we present an overview of our current understanding of resonant tunneling transport in polar heterostructures. In particular we focus on double-barrier III-Nitride RTDs which represents the simplest device in which the dramatic effects of the internal polarization fields can be studied. Tunneling transport within III-heterostructures is strongly influenced by the presence of the intense spontaneous and piezoelectric polarization fields which result from the non-centrosymmetric crystal structure of III-Nitride semiconductors. Advances in heterostructure design, epitaxial growth and device fabrication have led to the first unequivocal demonstration of robust and reliable negative differential conductance. which has been employed for the generation of microwave power from III-Nitride RTD oscillator. These significant advances allowed us to shed light into the physics of resonant tunneling transport in polar semiconductors which had remained hidden until now.
Volume
10918
Language
English
OCDE Knowledge area
Ingeniería de materiales
Otras ingenierías y tecnologías
Subjects
Scopus EID
2-s2.0-85065781127
Source
Proceedings of SPIE - The International Society for Optical Engineering
Resource of which it is part
Proceedings of SPIE - The International Society for Optical Engineering
ISSN of the container
0277786X
ISBN of the container
978-151062478-8
Conference
Gallium Nitride Materials and Devices XIV 2019
Sponsor(s)
This work was funded by the Office of Naval Research under the DATE MURI Program (Contract: N00014-11-10721, Program Manager: Dr. Paul Maki) and the National Science Foundation (NSF) MRSEC program (DMR-1719875). The authors also acknowledge partial support from NSF-DMREF (DMR-1534303) and EFRI-NewLAW (EFMA-1741694) programs. This work was performed in part at Cornell NanoScale Facility, an NNCI member supported by NSF Grant NNCI-1542081, and Cornell Center for Materials Research Shared Facilities which are supported through the NSF MRSEC program (DMR-1719875).
Sources of information:
Directorio de Producción Científica
Scopus