Title
Simulation of the ion current in computational environment using PIC method
Date Issued
28 December 2018
Access level
metadata only access
Resource Type
conference paper
Publisher(s)
Institute of Electrical and Electronics Engineers Inc
Abstract
The purpose of this paper is to present the importance to predict possible ion collection under plasma parameters. In this particular case, the computational object is a cube 10cmx10cmx10cm, similar in shape and size of a nanosatellite, surrounding by a simulating particles which in this case we set them as the same mass as atomic oxygen ions and a constant flux of ions hitting one side of the simulated object surface. Particle-in-Cell (PIC) and Particle Tracking simulation code were performed to quantify the expected the ion current and potential. Additionally, the bias negative surface is also simulated to verified the ion flux deflection into the bias surface. A comparison between a bias surface and non-bias surface is performed to verify that ion collection is enhanced. Results demonstrates that ion flux is focusing through the bias surface since there are more ions collect by the bias surface.
Language
English
OCDE Knowledge area
Ingeniería eléctrica, Ingeniería electrónica
Física de plasmas y fluídos
Ingeniería de sistemas y comunicaciones
Subjects
Scopus EID
2-s2.0-85061474168
Resource of which it is part
Proceedings of the 2018 IEEE 38th Central America and Panama Convention, CONCAPAN 2018
ISBN of the container
978-153866122-2
Conference
2018 IEEE 38th Central America and Panama Convention, CONCAPAN 2018
Sources of information:
Directorio de Producción Científica
Scopus