Title
Characterization of chain alignment at buried interfaces using Mueller matrix spectroscopy
Date Issued
01 June 2020
Access level
metadata only access
Resource Type
journal article
Author(s)
Smith B.H.
Xie R.
Lee W.
Adhikari D.
Adhikari D.
Podraza N.J.
Podraza N.J.
Gomez E.D.
Gomez E.D.
Pennsylvania State University
Publisher(s)
Cambridge University Press
Abstract
The stiffness of conjugated polymers should lead to chain alignment near buried interfaces, even if the polymer film is nominally amorphous. Although simulations predict that this alignment layer is approximately 1.5 times the persistence length, chain alignment at buried interfaces of amorphous polymers has not been experimentally measured. Using Mueller matrix spectroscopy, the optical response of regiorandom poly(3-hexylthiophene-2,5-diyl) (P3HT) was modeled in order to extract the aligned layer thickness. By approximating the optical properties of the aligned layer as that of regioregular P3HT, the data can be effectively modeled. When the film is thicker than 150 nm, optical properties are best described with a 4-nm aligned layer, which is quantitatively consistent with previous predictions.
Start page
292
End page
297
Volume
10
Issue
2
Language
English
OCDE Knowledge area
Física de partículas, Campos de la Física
Scopus EID
2-s2.0-85082682553
Source
MRS Communications
ISSN of the container
21596859
Sponsor(s)
Funding from the National Science Foundation through Award DMREF-1629006 and DMREF-1921854 is gratefully acknowledged. The authors thank Prof. Tom Jackson for use of a spectroscopic ellipsometer.
Sources of information: Directorio de Producción Científica Scopus