Title
Analyzing the Impact of Radiation-Induced Failures in Programmable SoCs
Date Issued
01 August 2016
Access level
metadata only access
Resource Type
journal article
Author(s)
Instituto de Informática
Publisher(s)
Institute of Electrical and Electronics Engineers Inc.
Abstract
All Programmable System-on-Chip (APSoC) devices are designed to provide higher overall system performance and programmable flexibility at lower power consumption and costs. Although modern commercial APSoCs offer a plethora of advantages, they are prone to experience Single Event Upsets. We investigate the impact of using different system architectures on an APSoC in the overall system failure rate. We consider different memory organization, different communication schemes, and different computing modes. Results show that there are several choices of architectures and resources to be chosen to implement an application in an APSoC, but there are logic resources that can increase or decrease the vulnerability of the entire system to failures in the application execution context.
Start page
2217
End page
2224
Volume
63
Issue
4
Language
English
OCDE Knowledge area
Sistemas de automatizaciĂłn, Sistemas de control
IngenierĂa de sistemas y comunicaciones
Subjects
Scopus EID
2-s2.0-84978252774
Source
IEEE Transactions on Nuclear Science
ISSN of the container
0018-9499
Sponsor(s)
This work was supported in part by CNPq, CAPES, FAPESP, and FAPERGS Brazilian Research Agencies.
Sources of information:
Directorio de ProducciĂłn CientĂfica
Scopus