Title
Large-signal FET modeling based on pulsed measurements
Date Issued
02 October 2007
Access level
metadata only access
Resource Type
conference paper
Author(s)
Brady R.
Brazil T.
Publisher(s)
Institute of Electrical and Electronics Engineers
Abstract
The new FET model presented in this paper highlights a method through which complex current flow dynamics, arising from typical dispersion phenomena, can be modeled in equivalent circuits. Static and bias-dependant dynamic/pulsed currents are characterized using a new single mathematical expression and subsequently implemented into a large-signal circuit topology as a single current source. The model is based on a well-established conventional DC model and only minimal alteration is required. In this work we extend the range of validity to full large-signal operation including accurate prediction of nonlinear harmonic distortion and inter-modulation distortion (IMD) products. Furthermore, the single current source approach enhances the overall equivalent circuit topology's consistency with the physical device, a particularly favorable feature in such device models. © 2007 IEEE.
Start page
593
End page
596
Language
English
OCDE Knowledge area
Ingeniería eléctrica, Ingeniería electrónica
Scopus EID
2-s2.0-34748875390
ISBN
1424406889 9781424406883
Source
IEEE MTT-S International Microwave Symposium Digest
Resource of which it is part
IEEE MTT-S International Microwave Symposium Digest
ISSN of the container
0149645X
Conference
2007 IEEE MTT-S International Microwave Symposium, IMS 2007
Sources of information: Directorio de Producción Científica Scopus