Title
Dielectric properties characterization: A simple inverse problem approach
Date Issued
29 June 2017
Access level
open access
Resource Type
conference paper
Author(s)
Universidad Estatal de Campinas
Publisher(s)
Institute of Electrical and Electronics Engineers Inc.
Abstract
A non-resonating technique for characterizing isotropic complex permittivity of dielectric substrates is presented. The technique is applicable to high or low ϵr and tan δ values. After measuring the S21 of a microstrip line with the unknown substrate, an inverse problem is built with an EM solver. Then, the complex permittivity parameters are extracted by means of solving the inverse problem using the Differential Evolution algorithm. The validity of the technique is assessed by characterizing two known and reliable dielectrics, in which the maximum error for the ϵr and tan δ was 7.6% and 16.67%, respectively.
Start page
22
End page
24
Language
English
OCDE Knowledge area
Sistemas de automatización, Sistemas de control
Ingeniería eléctrica, Ingeniería electrónica
Scopus EID
2-s2.0-85028514236
ISBN of the container
9781509048373
Conference
2017 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications, NEMO 2017
Sources of information:
Directorio de Producción Científica
Scopus