Title
Defect Detection on Andean Potatoes using Deep Learning and Adaptive Learning
Date Issued
21 October 2020
Access level
metadata only access
Resource Type
conference paper
Publisher(s)
Institute of Electrical and Electronics Engineers Inc.
Abstract
Potato is economically important in Peru, which is the first potato producer in Latin America, however, the quality of native potatoes need to be improved to increment their consumption. An automatic classification process to detect potato defects is important within the entire production chain to guarantee the high quality of the product. In the present research, a Convolutional Neural Network is used to detect defects in the Huayro potato surface. This is an Andean potato originally from Peru and is special because it has very marked eyes that can complicate the differentiation from pests that leaves holes in the potato. An adaptive learning was proposed in the work, where the principal idea is to evaluate continuously the learning of the neural network to adapt the training process (in this case the training data) to increment the learning performance. The detection results were around 88.2% of F1 score, providing a good performance of the algorithm.
Language
English
OCDE Knowledge area
Educación general (incluye capacitación, pedadogía)
Scopus EID
2-s2.0-85097844507
Resource of which it is part
Proceedings of the 2020 IEEE Engineering International Research Conference, EIRCON 2020
ISBN of the container
9781728183671
Conference
2020 IEEE Engineering International Research Conference, EIRCON 2020 Lima 21 October 2020 through 23 October 2020
Sponsor(s)
This work was supported by CONCYTEC-FONDECYT under the frame-work of the call E041-01 [contract number 047-2018-FONDECYT-BM-IADT-MU]
Sources of information: Directorio de Producción Científica Scopus