Title
HIGH VOLTAGE RESOLUTION ELECTRON MICROSCOPY OF COMPOUND SEMICONDUCTORS.
Date Issued
01 December 1983
Access level
metadata only access
Resource Type
conference paper
Author(s)
Smith D.J.
PONCE ANTUNEZ DE MAYOLO, FERNANDO AGUSTIN
Yamashita T.
Sinclair R.
Abstract
Several II-VI compound semiconductors have been observed with a 500kv high resolution electron microscope. The lattice defects occurring in ZnTe and ZnSe are described and compared with those found in CdTe.
Start page
31
End page
34
Language
English
OCDE Knowledge area
Electroquímica
Scopus EID
2-s2.0-0020932230
ISSN of the container
0195721X
Conference
Lawrence Berkeley Laboratory (Report) LBL
Sources of information: Directorio de Producción Científica Scopus