Title
Dangling bonds in amorphous silicon investigated by multifrequency EPR
Date Issued
01 September 2012
Access level
metadata only access
Resource Type
conference paper
Author(s)
Fehr M.
Schnegg A.
Lips K.
Astakhov O.
Finger F.
Freysoldt C.
Bittl R.
Teutloff C.
Helmholtz-Zentrum Berlin für Materialien und Energie
Abstract
Paramagnetic coordination defects in undoped hydrogenated amorphous silicon (a-Si:H) are studied using multifrequency pulsed electron-paramagnetic resonance (EPR) spectroscopy at S-, X-, Q- and W-band microwave frequencies (3.6, 9.7, 34, and 94 GHz, respectively). The improved spectral information extractable from a multifrequency fitting procedure allows us to conclude that the g tensor exhibits a rhombic splitting instead of axial symmetry. Our methods allow for precise and accurate determination of the g tensor principal values g x = 2.0079(2), g y = 2.0061(2) and g z = 2.0034(2) and their distribution parameters (g strain). © 2012 Elsevier B.V. All rights reserved.
Start page
2067
End page
2070
Volume
358
Issue
17
Language
English
OCDE Knowledge area
Ingeniería del Petróleo, (combustibles, aceites), Energía, Combustibles Ingeniería eléctrica, Ingeniería electrónica
Scopus EID
2-s2.0-84865737306
Source
Journal of Non-Crystalline Solids
ISSN of the container
00223093
Sponsor(s)
Financial support from BMBF (EPR-Solar network project 03SF0328) and discussions with M. Stutzmann and M. S. Brandt (TU Munich, Germany) are gratefully acknowledged.
Sources of information: Directorio de Producción Científica Scopus