Title
Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques
Date Issued
01 August 2016
Access level
open access
Resource Type
journal article
Author(s)
Chielle E.
Rosa F.
Rodrigues G.
Tambara L.
Macchione E.
Aguirre F.
Added N.
Medina N.
Aguiar V.
Silveira M.
Ost L.
Reis R.
Cuenca-Asensi S.
Kastensmidt F.
Instituto de Informática
Publisher(s)
Institute of Electrical and Electronics Engineers Inc.
Abstract
ARM processors are leaders in embedded systems, delivering high-performance computing, power efficiency, and reduced cost. For this reason, there is a relevant interest for its use in the aerospace industry. However, the use of sub-micron technologies has increased the sensitivity to radiation-induced transient faults. Thus, the mitigation of soft errors has become a major concern. Software-Implemented Hardware Fault Tolerance (SIHFT) techniques are a low-cost way to protect processors against soft errors. On the other hand, they cause high overheads in the execution time and memory, which consequently increase the energy consumption. In this work, we implement a set of software techniques based on different redundancy and checking rules. Furthermore, a low-overhead technique to protect the program execution flow is included. Tests are performed using the ARM Cortex-A9 processor. Simulated fault injection campaigns and radiation test with heavy ions have been performed. Results evaluate the trade-offs among fault detection, execution time, and memory footprint. They show significant improvements of the overheads when compared to previously reported techniques.
Start page
2208
End page
2216
Volume
63
Issue
4
Language
English
OCDE Knowledge area
Ciencias de la computación Hardware, Arquitectura de computadoras
Scopus EID
2-s2.0-84978286105
Source
IEEE Transactions on Nuclear Science
ISSN of the container
00189499
Sources of information: Directorio de Producción Científica Scopus