Title
Spatial resolution of a spherical x-ray crystal spectrometer at various magnifications
Date Issued
01 November 2016
Access level
metadata only access
Resource Type
conference paper
Author(s)
Gao L.
Hill K.
Bitter M.
Efthimion P.
Pablant N.
Baronova E.
Pereira N.
Princeton University
Publisher(s)
American Institute of Physics Inc.
Abstract
A high spatial resolution of a few μm is often required for probing small-scale high-energy-density plasmas using high resolution x-ray imaging spectroscopy. This resolution can be achieved by adjusting system magnification to overcome the inherent limitation of the detector pixel size. Laboratory experiments on investigating the relation between spatial resolution and system magnification for a spherical crystal spectrometer are presented. Tungsten Lβ2 rays from a tungsten-target micro-focus x-ray tube were diffracted by a Ge 440 crystal, which was spherically bent to a radius of 223 mm, and imaged onto an x-ray CCD with 13-μm pixel size. The source-to-crystal (p) and crystal-to-detector (q) distances were varied to produce spatial magnifications (M = q/p) ranging from 2 to 10. The inferred instrumental spatial width reduces with increasing system magnification M. However, the experimental measurement at each M is larger than the theoretical value of pixel size divided by M. Future work will focus on investigating possible broadening mechanisms that limit the spatial resolution.
Volume
87
Issue
11
Language
English
OCDE Knowledge area
Física de plasmas y fluídos
Óptica
Scopus EID
2-s2.0-84983681090
ISSN of the container
00346748
Conference
Review of Scientific Instruments
Sources of information:
Directorio de Producción Científica
Scopus