Title
Detecting fatigue crack closure and crack growth delays after an overload using DIC measurements
Date Issued
01 January 2018
Access level
metadata only access
Resource Type
conference paper
Author(s)
González J.
Castro J.
Freire J.
Pontificia Universidad Católica de Río de Janeiro
Publisher(s)
Springer New York LLC
Abstract
The closure and crack growth behaviors of a fatigue cracked DC(T) 4340 steel specimen before and after a single 100% overload on the stress intensity factor (SIF) peak, applied over an otherwise mode I loading with quasi-constant SIF range and load ratio, was studied using Digital Image Correlation (DIC) and strain gage techniques. A significant retardation in the post-overload fatigue crack growth rate was observed, and it recovered its pre-overload value only after the crack grew a distance much larger than the Irwin plastic zone induced by the overload. This behavior is attributed to discontinuous closure, since high values of crack opening loads were observed even outside the overload plastic zone. Full-field displacements and strains determined ahead of the crack tip and crack flank opening displacements measured at points along the crack faces from DIC analysis, as well as redundant back-face strain-gage measurements, support this claim.
Start page
57
End page
65
Volume
7
Language
English
OCDE Knowledge area
Ingeniería eléctrica, Ingeniería electrónica Ingeniería mecánica
Publication version
Version of Record
Scopus EID
2-s2.0-85033480761
Source
Conference Proceedings of the Society for Experimental Mechanics Series
Resource of which it is part
Fracture, Fatigue, Failure and Damage Evolution
ISSN of the container
2191-5644
ISBN of the container
978-331962830-1
Conference
Annual Conference and Exposition on Experimental and Applied Mechanics, 2017
Sponsor(s)
Acknowledgements G.L.G. Gonzáles gratefully acknowledge the support of the CNPq–Conselho Nacional de Desenvolvimento Científico e Tecnológico, Brazil (reference 152,795/2016–2).
Sources of information: Directorio de Producción Científica Scopus