Title
Circular intensity differential scattering measurements in the soft x-ray region of the spectrum (~16 EV to 500 EV)
Date Issued
01 January 1991
Access level
metadata only access
Resource Type
conference paper
Author(s)
Lawrence Berkeley Lab
Publisher(s)
Publ by Int Soc for Optical Engineering
Abstract
We propose the use of recently developed technique of circular intensity differential scattering (CIDS), as extended to the soft x-ray region of the spectrum (16 eV to 500 eV), to study the higher order organization of the eukaryotic chromosome. CIDS is the difference in scattering power of an object when illuminated by right circularly polarized vs. left circularly polarized electromagnetic radiation of arbitrary wavelength. CIDS has been shown to be a very sensitive measure of the helical organization of the scattering object, e.g., the eukaryotic chromosome. Preliminary results of measurements of samples of bacteriophages and octopus sperm done at SRC, Wisconsin, show the technique to be very sensitive to the dimensional parameters of the particles interrogated by circularly polarized light.
Start page
179
End page
187
Volume
1548
Language
English
OCDE Knowledge area
Otras ingenierías y tecnologías
Radiología, Medicina nuclear, Imágenes médicas
Scopus EID
2-s2.0-0026372812
Source
Proceedings of SPIE - The International Society for Optical Engineering
Resource of which it is part
Proceedings of SPIE - The International Society for Optical Engineering
ISSN of the container
0277786X
ISBN of the container
0819406767
Conference
Production and Analysis of Polarized X Rays
Sources of information:
Directorio de Producción Científica
Scopus