Title
Length control and sharpening of atomic force microscope carbon nanotube tips assisted by an electron beam
Date Issued
01 November 2005
Access level
metadata only access
Resource Type
research article
Author(s)
Martinez J.
Yuzvinsky T.D.
Fennimore A.M.
Zettl A.
García R.
University of California
Abstract
We report on the precise positioning of a carbon nanotube on an atomic force microscope (AFM) tip. By using a nanomanipulator inside a scanning electron microscope, an individual nanotube was retrieved from a metal foil by the AFM tip. The electron beam allows us to control the nanotube length and to sharpen its end. The performance of these tips for AFM imaging is demonstrated by improved lateral resolution of DNA molecules. © 2005 IOP Publishing Ltd.
Start page
2493
End page
2496
Volume
16
Issue
11
Language
English
OCDE Knowledge area
Nano-tecnología
Subjects
Scopus EID
2-s2.0-26444552041
Source
Nanotechnology
ISSN of the container
09574484
Sources of information:
Directorio de Producción Científica
Scopus