Title
Interferometric measurement of thickness and refraction index on transparent thin films
Date Issued
01 January 2010
Access level
metadata only access
Resource Type
conference paper
Author(s)
Tangarife E.
Universidad de Antioquia
Publisher(s)
Optical Society of America (OSA)
Abstract
A Mach-Zenhder interferometer is proposed with a thin film on one of its arms, the sample can be rotated, measuring the pattern fringes for each incidence angle, sample thickness and refraction index are calculated. © 2010 OSA/FiO/LS.
Language
English
OCDE Knowledge area
Otras ingenierías y tecnologías
Física de la materia condensada
Scopus EID
2-s2.0-85088759176
Source
Optics InfoBase Conference Papers
ISSN of the container
21622701
Conference
24 October 2010through 28 October 2010
Sources of information:
Directorio de Producción Científica
Scopus