Title
Measuring the quality of shifting and scaling patterns in biclusters
Date Issued
10 November 2010
Access level
open access
Resource Type
conference paper
Author(s)
Universidad Pablo de Olavide
Abstract
The most widespread biclustering algorithms use the Mean Squared Residue (MSR) as measure for assessing the quality of biclusters. MSR can identify correctly shifting patterns, but fails at discovering biclusters presenting scaling patterns. Virtual Error (VE) is a measure which improves the performance of MSR in this sense, since it is effective at recognizing biclusters containing shifting patters or scaling patterns as quality biclusters. However, VE presents some drawbacks when the biclusters present both kind of patterns simultaneously. In this paper, we propose a improvement of VE that can be integrated in any heuristic to discover biclusters with shifting and scaling patterns simultaneously. © 2010 Springer-Verlag.
Start page
242
End page
252
Volume
6282 LNBI
Language
English
OCDE Knowledge area
Bioinformática
Scopus EID
2-s2.0-78049456342
Source
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Resource of which it is part
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
ISSN of the container
16113349
ISBN of the container
978-364216000-4
Conference
5th IAPR International Conference on Pattern Recognition in Bioinformatics, PRIB 2010
Sponsor(s)
This research is supported by the Spanish Ministry of Science and Technology under grant TIN2007-68084-C02-00 and the Junta de Andalucía Research Program.
Sources of information:
Directorio de Producción Científica
Scopus