Title
Structural evolution during lithiation of sputtered V<inf>2</inf>O<inf>5</inf> films
Date Issued
01 May 1995
Access level
metadata only access
Resource Type
journal article
Author(s)
Granqvist C.
Chalmers University of Technology
Publisher(s)
Springer-Verlag
Abstract
LixVO2.5 films were made by reactive dc magnetron sputtering followed by galvanostatic treatment in LiClO4. Structural evolution for x increasing from zero to ≈ 1, studied by X-ray diffraction, was consistent with a VO5-based layer configuration with progressively increasing layer separation and puckering. Two-phase behavior was found for x>1. © 1995 Springer-Verlag.
Start page
521
End page
522
Volume
60
Issue
5
Language
English
OCDE Knowledge area
Física y Astronomía
Física atómica, molecular y química
Subjects
Scopus EID
2-s2.0-0029306904
Source
Applied Physics A Materials Science & Processing
ISSN of the container
14320630
Sources of information:
Directorio de Producción Científica
Scopus