Title
Voltage, current and resistance comparison June 2007 - October 2009
Date Issued
01 January 2014
Access level
metadata only access
Resource Type
journal article
Author(s)
Sanchez H.
Cioffi J.
Ventura R.
Ferreira V.
Ramos R.
Martinez A.
Montaluisa J.
Gonzalez J.
Hamilton F.
Elmquist R.
Zhang N.F.
Izquierdo D.
INMETRO
Publisher(s)
Institute of Physics Publishing
Abstract
This is a report of the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of equivalence between those laboratories in accordance with the CIPM Mutual Recognition Agreement. From June 2007 to October 2009, four multimeters were used as traveling standards for measurements in eleven countries, with NIST-USA acting as pilot laboratory. Results for nine measurement points are presented as errors relative to a comparison reference value together with their uncertainty.
Volume
51
Issue
1A
Language
English
OCDE Knowledge area
Ingeniería eléctrica, Ingeniería electrónica Ingeniería mecánica
Scopus EID
2-s2.0-84945287058
Source
Metrologia
ISSN of the container
00261394
Sources of information: Directorio de Producción Científica Scopus