Title
On the preparation of vanadium doped PVT grown SiC boules with high semi-insulating yield
Date Issued
01 July 2003
Access level
metadata only access
Resource Type
journal article
Author(s)
University of Erlangen-Nürnberg
Publisher(s)
Elsevier
Abstract
Different approaches to prepare SiC crystals with high semi-insulating yield and homogeneous electrical properties by adding a vanadium source in PVT SiC bulk growth are investigated. Up to four different compensation regimes are formed during SiC bulk growth depending on the concentration of other incorporated impurities. Vanadium doping leads to semi-insulating SiC regimes with thermal activation energies of either about 900 meV or about 1.7 meV as measured with temperature-dependent Hall effect. A yield of semi-insulating material of 80% of the boule has been achieved by a doping technique utilizing an inner container placed inside the crucible. The yield was limited only by the high initial nitrogen incorporation which exceeds the solubility limit of vanadium in SiC of 4 × 1017 cm-3 especially in the early stages of growth. Using vanadium/boron co-doping, thermal activation energies of about 1.7 eV are found. But in this case the yield is restricted to 40% maximum due to the time-dependent incorporation of vanadium, boron, and nitrogen. Finally, measurement techniques to observe the V3+ and V5+ concentration in the crystal are presented which allow direct determination of the compensation regime at different stages of growth. © 2003 Elsevier Science B.V. All rights reserved.
Start page
390
End page
399
Volume
254
Issue
April 3
Language
English
OCDE Knowledge area
Ingeniería de materiales
Subjects
Scopus EID
2-s2.0-0037850705
Source
Journal of Crystal Growth
ISSN of the container
00220248
Sponsor(s)
Funding text
This work is supported by the Bayerische Forschungsstiftung and SiCrystal AG under contract Nr. 362/99. The authors thank T. Straubinger, B. Epelbaum and M. Rasp for fruitful discussions, W. Hartung for the Fermi level calculations and W. Jantz, IAF, Freiburg/Germany for the TDCM measurements.
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