Title
Quantum wells based structures tested by photoreflectance anisotropy spectroscopy at room temperature
Other title
[Estructuras basadas en pozos cuánticos analizadas por fotorreflectancia anisotrópica a temperatura ambiente]
Date Issued
01 September 2019
Access level
open access
Resource Type
journal article
Author(s)
Díaz de león-Zapata R.
Flores-García E.
Ortega-Gallegos J.
Tecnológico Nacional de México/IT de San Luis Potosí
Publisher(s)
Universidad Autonoma Metropolitana Iztapalapa
Abstract
We report the visualization of interface optical anisotropics in III-V semiconductor based coupled double quantum wells by using photoreflectance anisotropy spectroscopy. Interfacial optical anisotropics were detected from buried layers with quantum dimensions at room temperature through a piezoelectric shear strain. The discrete transitions associated to coupled double quantum wells were observed in near-infrared range, specifically in the second telecommunication band. We propose to use this extended photoreflectance spectroscopy through a polarization contrast as a simple and complementary optical method for analyzing anisotropic quantum structures with polarizable defects or anti-symmetries.
Start page
825
End page
830
Volume
18
Issue
3
Language
English
OCDE Knowledge area
Física y Astronomía Química
Scopus EID
2-s2.0-85071226917
Source
Revista Mexicana de Ingeniera Quimica
ISSN of the container
16652738
Sponsor(s)
The authors are grateful to T. Mozume and S. Gozu from the AIST (Tsukuba, Japan) for providing the samples used in this work. Also, the authors are grateful to R. Balderas, A. Lastras and L. F. Lastras for many helpful discussions. This work was partially supported by CONACYT, SECITI-DF and Tecnológico Nacional de México. The authors are grateful to T. Mozume and S. Gozu from the AIST (Tsukuba, Japan) for providing the samples used in this work. Also, the authors are grateful to R. Balderas, A. Lastras and L. F. Lastras for many helpful discussions. This work was partially supported by CONACYT, SECITI-DF and Tecnol?gico Nacional de M?xico.
Sources of information: Directorio de Producción Científica Scopus