Title
Guiding the Exploration of Scatter Plot Data Using Motif-Based Interest Measures
Date Issued
30 October 2015
Access level
open access
Resource Type
conference paper
Author(s)
Publisher(s)
Institute of Electrical and Electronics Engineers Inc.
Abstract
Finding interesting patterns in large scatter plot spaces is a challenging problem and becomes even more difficult with increasing number of dimensions. Previous approaches for exploring large scatter plot spaces like e.g., the well-known Scagnostics approach, mainly focus on ranking scatter plots based on their global properties. However, often local patterns contribute significantly to the interestingness of a scatter plot. We are proposing a novel approach for the automatic determination of interesting views in scatter plot spaces based on analysis of local scatter plot segments. Specifically, we automatically classify similar local scatter plot segments, which we call scatter plot motifs. Inspired by the well-known tf-idf approach from information retrieval, we compute local and global quality measures based on certain frequency properties of the local motifs. We show how we can use these to filter, rank and compare scatter plots and their incorporated motifs. We demonstrate the usefulness of our approach with synthetic and real-world data sets and showcase our corresponding data exploration tool that visualizes the distribution of local scatter plot motifs in relation to a large overall scatter plot space.
Language
English
OCDE Knowledge area
Ciencias de la computación
Scopus EID
2-s2.0-84962280656
ISBN of the container
978-146737343-2
Conference
2015 Big Data Visual Analytics, BDVA 2015
Sponsor(s)
This work was partially supported by the State of Baden-Württemberg within the research project Visual Search and Analysis Methods for Time-Oriented Annotated Data, With Applications to Research and Open Data.
Sources of information:
Directorio de Producción Científica
Scopus