Title
Pedestal waveguides based on GeO2-Bi2O3, GeO2-PbO, Ta2O5 and SiOxNy cores as platforms for optical amplifiers and nonlinear optics applications: Review of recent advances
Date Issued
01 August 2021
Access level
metadata only access
Resource Type
review
Author(s)
Sierra J.H.
Carvalho D.O.
Kassab L.R.P.
da Silva Bordon C.D.
Samad R.E.
Wetter N.U.
Universidad de São Paulo
Publisher(s)
Elsevier B.V.
Abstract
In this review we present recent advances regarding pedestal waveguides using different cores based on GeO2-Bi2O3, GeO2-PbO, Ta2O5 and SiOxNy materials for optical amplifiers and nonlinear optics applications. The pedestal platform, based on Si technology, is interesting for materials that are hardly etched by conventional techniques as is the case of heavy metal oxide cores. The present results review recent technological advances to fabricate pedestal waveguides with and without Cr mask. The fabrication mechanism that does not use Cr mask and avoids micromasking effect is shown. The advantages of this process are discussed as well as its appropriateness to produce pedestal waveguides for optical amplification at 1.53 μm and nonlinear optics applications. Comparison with pedestal waveguides prepared with Cr mask is also included to highlight the advantages that the new technique performed in the absence of Cr mask may provide, regarding propagation losses at the infrared region. Results of pedestal waveguides performance improvement, due to the scattering of large silicon nanostructures is also reviewed opening new possibilities for more efficient pedestal waveguides for optical amplification.
Volume
236
Language
English
OCDE Knowledge area
Ingeniería eléctrica, Ingeniería electrónica Óptica
Scopus EID
2-s2.0-85105341516
Source
Journal of Luminescence
ISSN of the container
00222313
Sponsor(s)
This work was performed in the framework of the National Institute of Photonics (INCT de Fotônica, 465.763/2014 ) project supported by the Conselho Nacional de Desenvolvimento Científico e Tecnológico ( CNPq ). We also thank the support from Coordenação de Aperfeiçoamento de Pessoal de Ensino Superior ( CAPES ). We acknowledge the Nanotechnology National Laboratory ( LNNano ), CNPEM -Campinas/Brazil, for the HR-TEM measurements and Fundação de Amparo à Pesquisa do Estado de São Paulo ( FAPESP ).
Sources of information: Directorio de Producción Científica Scopus